Vol 28 | Issue 6
This issue of D&T features six articles on postsilicon calibration and repair. The articles span both design and test aspects of chip and system design, and highlight the interplay between design and test solutions.
Editor
Articles
IEEE Design & Test of Computers – Advertisement
Issue Date: Nov.-Dec. 2011
Volume: 28 Issue:6
A Promising Alternative to Conventional Silicon [Guest editors' introducton]
This special issue of Design & Test provides an overview on the challenges, the current… Read More »
IEEE Design & Test of Computers – Advertisement
Issue Date: Nov.-Dec. 2011
Volume: 28 Issue:6
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