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Design & Test Magazine

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Vol 28 | Issue 6

This issue of D&T features six articles on postsilicon calibration and repair. The articles span both design and test aspects of chip and system design, and highlight the interplay between design and test solutions.

Editor

Krishnendu Chakrabarty
Electrical and Computer Engineering
Duke University
Box 90291, 130 Hudson Hall
Durham, NC 27708
Tel : +1 (919) 660-5244 Fax : +1 (919) 660-5293
krish@ee.duke.edu

Articles

IEEE Design & Test of Computers – Advertisement
Date of Publication: Nov.-Dec. 2011 Volume: 28,   Issue: 6
IEEE Design & Test of Computers – Annual Index
2011 Design and Test Annual Index Read More »
IEEE Design & Test of Computers – Annual Index
2011 Design and Test Annual Index Read More »

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