Volume 35 | Issue 5

IEEE Design & Test offers original works describing the methods used to design and test electronic product hardware and supportive software.

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Editor

Jörg Henkel
Professor and Chair for Embedded Systems
Karlsruhe Institute of Technology, Germany
henkel@kit.edu

Articles

Presents the front cover for this issue of the publication.

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Presents a listing of the editorial board, board of governors, current staff, committee members, and/or society editors for this issue of the publication.

Presents the table of contents for this issue of the publication.

This issue highlights the second part of the highly successful special issue of “Self-Awareness in Systems on Chip.” Thanks to Guest Editors Nikil Dutt and Axel Jantsch for their work in bringing five research articles to this special issue. The first part of this special issue was published in the November/December 2016 issue (vol. 34, no. 6). I want to also particularly... Read more on IEEE Xplore