Volume 33 | Issue 6

IEEE Design & Test offers original works describing the methods used to design and test electronic product hardware and supportive software.

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Editor

Jörg Henkel
Professor and Chair for Embedded Systems
Karlsruhe Institute of Technology, Germany
henkel@kit.edu

Articles

Presents the front cover for this issue of the publication.

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Presents a listing of the editorial board, board of governors, current staff, committee members, and/or society editors for this issue of the publication.

Presents the table of contents for this issue of the publication.

Automotive has become a field of high interest in the design and test communities. As a result of a very successful workshop held in conjunction with International Test Conference 2016 in Fort Worth, the idea of this special issue was born. Many thanks to the guest editors Hans-Joachim Wunderlich and Yervant Zorian for bringing this hot topic to <italic>IEEE Design&Test</italic>... Read more on IEEE Xplore