Volume 33 | Issue 6

IEEE Design & Test offers original works describing the methods used to design and test electronic product hardware and supportive software.

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Editor

Jörg Henkel
Professor and Chair for Embedded Systems
Karlsruhe Institute of Technology, Germany
henkel@kit.edu

Articles

Presents the front cover for this issue of the publication.

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Presents a listing of the editorial board, board of governors, current staff, committee members, and/or society editors for this issue of the publication.

Presents the table of contents for this issue of the publication.

<fig position="float" orientation="portrait"> <graphic position="float" orientation="portrait" xlink:href="henke-2847901.tif"/> </fig>This issue focuses on the second part of the very successful special issue on designing and testing time-critical systems with six technical papers. Again, many thanks to Guest Editors Tulika Mitra... Read more on IEEE Xplore