Volume 65 | Issue 7

The theory, analysis, (computer aided) design, and practical implementation of circuits, and the application of circuit theoretic techniques to systems and to signal processing. Only brief papers (maximum length less or equal five pages in standard IEEE Transactions submissions ) are considered for possible publication.

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Dr. Chi K. Michael Tse
Editor in Chief
Department of Electronic Engineering
Hong Kong Polytechnic University
tcas2-eic@ieee-cas.org

Dr. Jose M. de la Rosa
Deputy Editor-in-Chief
Institute of Microelectronics of Seville, IMSE-CNM
tcas2-deic@ieee-cas.org

Articles

Presents the table of contents for this issue of the publication.

Presents a listing of the editorial board, board of governors, current staff, committee members, and/or society editors for this issue of the publication.

This brief presents a microwave rectifier using a novel impedance matching technique to extend the operating bandwidth. Originated from the impedance control at two separated frequencies, the matching network is capable of manipulating the impedance over a wide frequency band by three steps. In this way, the operating bandwidth is extended. Theoretical analysis is carried out and closed-form... Read more on IEEE Xplore

This brief proposes a low-power 12-bit column-parallel extended counting analog-to-digital converter (EC ADC) without calibration for CMOS image sensors. The proposed 12-bit EC ADC uses the <inline-formula> <tex-math notation="LaTeX">${Delta Sigma }$ </tex-math></inline-formula> ADC and single-slope ADC (SS ADC) to convert the input voltage to the upper 4 bit and... Read more on IEEE Xplore

We propose an analog delay line (ADL) that adopts a current-splitting method (CSM) to reduce power consumption. The proposed ADL employs a pipelined sample-and-hold architecture and includes a buffer in the analog memory cell to prevent a charge sharing problem. The CSM reduces power consumption without distorting the sampled data by dividing the current source of the buffer into a holding... Read more on IEEE Xplore