SERESSA 2020, a CAS technically supported event, combines academic, government, and industrial communities working in the area of radiation and its effects on embedded systems. Radiation effects are a significant concern for space and avionics systems, as well as for critical applications operating at ground levels like in automotives, high energy facilities, medical facilities, and even banking. This school is based on lectures and exercises involving real case studies using the common tools of the domain. The intended audience includes both beginning and experienced researchers, engineers, and post-graduate students wishing to enhance their knowledge base in this rapidly evolving field.

SERESSA 2020 registration is free for all IEEE CAS Members.

Topics covered by SERESSA include radiation environment, spacecraft anomalies, single-event effects (SEE), total dose effects (TID), radiation effects in power systems, radiation effects in solar cells, architecture hardening in analog, digital circuits, and in memories, software hardening, effects in FPGAs, hardness assurance, rate prediction, radiation testing, laser testing, and remote testing experiments. 

SERESSA was first organized in 2005 and was hosted in the middle of the Amazon Jungle, in Manaus, Brazil. Since then it has moved around the world, being held in Seville, Buenos Aires, Palm Beach, Takasaki, São José dos Campos, Toulouse, Ansan, Moscow, Bariloche, Puebla, Montreal, Munich, and Noordwijk. The 2020 15th-anniversary edition of SERESSA will be hosted virtually, from Porto Alegre, Brazil.

Confirmed Talks and Speakers

Effects of Radiation on Multijunction Solar Cells for Space Application 
José Ramón González, European Space Agency, The Netherlands 
Single Event Effects 
Stephen Buchner, Naval Research Laboratory, USA
SEE Effects on VLSI Devices: Challenges and Solutions 
Luca Sterpone, Politecnico de Torino, Italy 
Circuit Level Design Methods to Mitigate Soft Errors 
Ricardo Reis, UFRGS, Brazil 
Alexandra Zimpeck, UCPel, Brazil 
Pavel Chubunov, URSC-ISDE, Russia 
Error-rate Prediction for Programmable Circuits: Methodology, Tools and Studied Cases 
Raoul Velazco, TIMA, France 
Accelerator Radiation Environment: Modeling and Monitoring Tools and Approaches 
Giuseppe Lerner, CERN, Switzerland 
Brazilian Facilities and Case-studies
Marcilei Guazzelli da Silveira, FEI, Brazil 
Nilberto Heder Medina, USP, Brazil 
Odair Lelis Gonçalez, IEAv, CTA, Brazil 
Tiago Balen, UFRGS, Brazil 
Hardness Assurance 
Stephen Buchner, Naval Research Laboratory, USA 
Assurance Guidelines for Next-Generation Exploration Systems 
Jonathan Pellish, NASA, USA 
SEE Test Methods 
Pavel Chubunov, URSC-ISDE, Russia
Characterizing FPGA Failure Probabilities for Critical Space Systems 
Melanie Berg, Space R2 LLC, USA 
Sung Chung, QRT, South Korea  
COTS in Space: Qualified Commercial Components for Space 
Jaime Estela, Spectrum Aerospace Technologies, Germany 
System Hardening and Real Space Applications 
Michel Pignol, CNES, France 
Enhanced Observation Framework for Embedded Systems Exposed to Radiations 
Fakhreddine Ghaffari Ensea, CY Cergy Paris University, France 
Fault Injection and Formal Verification Methodologies 
Luis Alfonso Entrena Arrontes, Universidad Carlos III de Madrid, Spain  
Ionizing Radiation Effects on CMOS Image Sensors 
José Lipovetzky, Argentina 
Analyzing the Reliability of Neural Networks in Programmable SoC Devices 
Fernanda Lima Kastensmidt, UFRGS, Brazil 
Analyzing Data Extracted from Radiation Tests in Advanced SRAMs 
Juan A. Clemente, Universidad Complutense de Madrid, Spain 
Radiation-Hardening-by-Design of CMOS Integrated Circuits
Yann Deval, IMS, Bordeaux, France 
Routing in Fault-Prone Delay-Tolerant Networks 
Juan A. Fraire, National University of Córdoba, Argentina and University of Saarlandes, Germany 
NanosatC-Br Program and Development of Radiation Hardened Integrated Circuits for Satellites Applications 
João Baptista Martins, UFSM, Brazil  
Nelson Schuch, INPE- SM, Brazil 
Radiation Effects and Mitigation Techniques in GPU 
Paolo Rech, UFRGS, Brazil 
José Rodrigo Azambuja, UFRGS, Brazil 
Radiation Test Requirements for Functional Safety Standards 
Paolo Rech, UFRGS, Brazil 
José Rodrigo Azambuja, UFRGS, Brazil 

Call for Posters

Regular Posters
Participants of SERESSA 2020 are invited to share their main line of research and recent results during the poster session. The purpose of this session is to promote interaction among different groups and to stimulate possible collaborations among participants. 

Student Posters
Students attending SERESSA 2020 are encouraged to present their recent studies by participating in the Best Student Poster Competition. Student participants that submit a poster will be granted free registration. 

Participants for both poster sessions can directly upload their abstract and poster in the ’Poster Submission' tab.

Authors from both modalities (students-competition and general) will have the opportunity to present their contributions through a three-minute recorded talk and a real-time slot for Q&A.

Important Dates
  • Posters Submission Deadline: 20 November 2020 
  • Acceptance Notification: 24 November 2020
  • Submission of Final Version: 27 November 2020

More information can be found on the event webpage.