IEEE Design & Test Magazine
IEEE Design & Test offers original works describing the models, methods and tools used to design and test microelectronic systems from devices and circuits to complete systems-on-chip and embedded software. The magazine focuses on current and near-future practice, and includes tutorials, how-to articles, and real-world case studies. The magazine seeks to bring to its readers not only important technology advances but also technology leaders, their perspectives through its columns, interviews and roundtable discussions. Topics include semiconductor IC design, semiconductor intellectual property blocks, design, verification and test technology, design for manufacturing and yield, embedded software and systems, low-power and energy efficient design, electronic design automation tools, practical technology, and standards.
It was published as IEEE Design & Test of Computers between 1984 and 2012.
The articles in this journal are peer reviewed in accordance with the requirements set forth in the IEEE PSPB Operations Manual (sections 8.2.1.C & 8.2.2.A). Each published article was reviewed by a minimum of two independent reviewers using a single-blind peer review process, where the identities of the reviewers are not known to the authors, but the reviewers know the identities of the authors. Articles will be screened for plagiarism before acceptance.
This publication considers original works that enhance the existing body of knowledge. Original review articles and surveys are acceptable, even if new data/concepts are not presented. Results described in the article should not have been submitted or published elsewhere. Expanded versions of conference publications may be submitted. Articles must be intelligible and must be written in standard English.
- Peer Review: Peer review is vital to the quality of published research. Each article submitted to IEEE is evaluated by at least two independent reviewers selected by a member of the publication's editorial board. Learn more about the IEEE peer review process.
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- Errors in Published Articles: Authors who have detected an error in their published article should contact the Editor-in-Chief shown above to request the publication of a correction. Note that no change may be made to the original article after it is published in IEEE Xplore. Comment or Letter to the Editor articles which discuss an article in this publication will be considered. The authors of the original article will be given the opportunity to reply to the Comment or Letter to the Editor. Submit your Comment or Letter to the Editor article via Submit Manuscript at the top of the page.