IEEE Transactions on Very Large Scale Integration Systems

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IEEE Transactions on Very Large Scale Integration (VLSI) Systems covers design and realization of microelectronic systems using VLSI/ULSI technologies that require close collaboration among scientists and engineers in the fields of systems architecture, logic and circuit design, chips and wafer fabrication, packaging, testing and systems applications. Generation of specifications, design and verification must be performed at all abstraction levels, including the system, register-transfer, logic, circuit, transistor and process levels.

To address this critical area through a common forum, the IEEE Transactions on VLSI Systems was founded. The editorial board, consisting of international experts, invites original papers which emphasize the novel system integration aspects of microelectronic systems, including interactions among system design and partitioning, logic and memory design, digital and analog circuit design, layout synthesis, CAD tools, chips and wafer fabrication, testing and packaging, and system level qualification. Thus, the coverage of this Transactions focuses on VLSI/ULSI microelectronic system integration.

Topics of special interest include, but are not strictly limited to, the following:

  • System Specification, Design and Partitioning
  • System-level Test
  • Reliable VLSI/ULSI Systems
  • High Performance Computing and Communication Systems
  • Wafer Scale Integration and Multichip Modules (MCMs)
  • High-Speed Interconnects in Microelectronic Systems
  • VLSI/ULSI Neural Networks and Their Applications
  • Adaptive Computing Systems with FPGA components
  • Mixed Analog/Digital Systems
  • Cost, Performance Tradeoffs of VLSI/ULSI Systems
  • Adaptive Computing Using Reconfigurable Components (FPGAs) 

The articles in this journal are peer reviewed in accordance with the requirements set forth in the IEEE PSPB Operations Manual (sections 8.2.1.C & 8.2.2.A). Each published article was reviewed by a minimum of two independent reviewers using a single-blind peer review process, where the identities of the reviewers are not known to the authors, but the reviewers know the identities of the authors. Articles will be screened for plagiarism before acceptance.

Corresponding authors from low-income countries are eligible for waived or reduced open access APCs.


This publication considers original works that enhance the existing body of knowledge. Results described in the article should not have been submitted or published elsewhere. Expanded versions of conference publications may be submitted. Articles must be intelligible and must be written in standard English.

  • Peer Review: Peer review is vital to the quality of published research. Each article submitted to IEEE is evaluated by at least two independent reviewers selected by a member of the publication's editorial board. Learn more about the IEEE peer review process.
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  • Errors in Published Articles: Authors who have detected an error in their published article should contact the Editor-in-Chief shown above to request the publication of a correction. Note that no change may be made to the original article after it is published in IEEE Xplore. Comment or Letter to the Editor articles which discuss an article in this publication will be considered. The authors of the original article will be given the opportunity to reply to the Comment or Letter to the Editor. Submit your Comment or Letter to the Editor article via Submit Manuscript above.
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Associate Editor TVLSI